41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)


Refreshment Break

Sunday, November 1, 2015

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8:00 AM-11:30 AM


Package and Physical Analysis Challenges
Session Chair: Mr. Chris Richardson and Ms. Susan Li

8:00 AM-2:00 PM


Electrical and Yield
Session Chair: Dr. Jenny Ma and Mr. Gregory M. Johnson

8:00 AM-2:30 PM


Fault Isolation
Session Chair: Dr. Mayue Xie and Mr. David Vallett

12:30 PM-5:30 PM


Microscopy
Session Chair: Mr. Jake E. Klein and Mr. Carl Nail

2:00 PM-5:00 PM


Technology Specific FA
Session Chair: Mr. Mark Jenkins and Mr. Corey Senowitz

Monday, November 2, 2015

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8:00 AM-9:10 AM


Opening Session

9:10 AM-9:30 AM


Refreshment Break

9:30 AM-10:45 AM


1
Emerging FA Techniques and Concepts
Session Chair: Mr. Terence Kane and Mr. Phil Kaszuba

10:45 AM-12:00 PM


2
Fault Isolation I
Session Chair: Dr. Michael Bruce and Dr. Paiboon Tangyunyong

12:00 PM-1:00 PM


Monday Lunch

1:00 PM-1:50 PM


3
Scanning Probe Analysis
Session Chair: Mr. Phil Kaszuba and Mr. Terence Kane

1:00 PM-2:15 PM


4
FIB Sample Preparation
Session Chair: Dr. Tom Schamp and Mr. Carl Nail

1:50 PM-3:30 PM


5
Fault Isolation II
Session Chair: Dr. Michael Bruce and Dr. Paiboon Tangyunyong

2:15 PM-3:30 PM


6
FIB Circuit Analysis and Edit
Session Chair: Dr. Michael DiBattista and Mr. Jason M. Benz, BS/MS Microelectronic Eng & Materials Science

3:30 PM-3:40 PM


Refreshment Break

3:40 PM-5:40 PM


Contactless Fault Isolation User Group

FIB User Group

5:00 PM-6:00 PM


Tools of the Trade Tour *Separate Registration Required

7:00 PM-9:30 PM


Off-Site Social Event - Punch Bowl Social

Tuesday, November 3, 2015

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9:00 AM-10:30 AM


Plenary Session

10:30 AM-11:10 AM


Refreshment Break

11:10 AM-12:00 PM


7
Board and System Level FA
Session Chair: Mr. Ted Kolasa and Ms. Victoria Bruce

8
Microscopy
Session Chair: Mr. Carl Nail and Dr. Tom Schamp

12:00 PM-1:30 PM


Tuesday Lunch

1:30 PM-2:55 PM


Refresh & Energize Break

2:55 PM-4:05 PM


9
3D Devices Failure Analysis I
Session Chair: Mr. Frank Altmann and Dr. Yan Li

2:55 PM-5:00 PM


10
Detecting Counterfeit Microelectronics I
Session Chair: Mr. Robert Champaign and Mr. Joe Colangelo

5:00 PM-6:40 PM


Expo Welcome Reception

Wednesday, November 4, 2015

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8:00 AM-8:50 AM


11
Metrology and In-line Device Characterization
Session Chair: Mr. Bryan Tracy and Dr. Huimeng Wu

8:00 AM-9:30 AM


Medical Device Tutorial

9:30 AM-10:30 AM


Refreshment Break

10:10 AM-12:10 PM


Panel Discussion - 1st Silicon Debug: Rapid Identification and Correction of Product Systematic Failures
Session Chair: Mr. Tracy Myers

12:10 PM-1:30 PM


EDFAS Luncheon and General Membership Meeting

1:30 PM-3:00 PM


Video Contest
Session Chair: Ms. Rose Ring and Dr. Eckhard Langer

1:30 PM-3:30 PM


22
3D Devices Failure Analysis - Poster
Session Chair: Mr. Frank Altmann and Dr. Yan Li

23
Case Studies and FA Process - Posters
Session Chair: Dr. Zhigang Song and Ms. Rose Ring

24
Device FA - Posters
Session Chair: Mr. Ted Kolasa and Ms. Victoria Bruce

25
Emerging FA Techniques and Concepts - Poster
Session Chair: Mr. Phil Kaszuba and Mr. Terence Kane

26
FA Lab Management - Posters
Session Chair: Dr. Zhigang Song and Ms. Rose Ring

27
Fault Isolation - Posters
Session Chair: Dr. Michael Bruce and Dr. Paiboon Tangyunyong

28
FIB Circuit Analysis and Edit - Poster
Session Chair: Mr. Jason M. Benz, BS/MS Microelectronic Eng & Materials Science and Dr. Michael DiBattista

29
Metrology and In-line Characterization - Posters
Session Chair: Mr. Bryan Tracy and Dr. Huimeng Wu

30
Microscopy - Posters
Session Chair: Mr. Carl Nail and Dr. Tom Schamp

31
Student Posters
Session Chair: Mr. Kent Erington and Mr. Randal E. Mulder

32
Packaging and Assembly Level FA - Posters
Session Chair: Dr. Lihong Cao and Mr. Bhanu P. Sood

33
Sample Preparation and Device Deprocessing - Posters
Session Chair: Mr. Roger Alvis and Mr. Jake E. Klein

34
Scanning Probe Analysis - Posters
Session Chair: Mr. Phil Kaszuba and Mr. Terence Kane

Exhibitor Dessert Reception

3:30 PM-4:45 PM


12
3D Device Failure Analysis II
Session Chair: Dr. Yan Li and Mr. Frank Altmann

13
Diagnostic Testing, Scanning and Debug
Session Chair: Mr. Geir Eide and Mr. Mark E. Kimball

4:45 PM-6:00 PM


14
Detecting Counterfeit Microelectronics II
Session Chair: Mr. Robert Champaign and Mr. Joe Colangelo

15
Device FA
Session Chair: Ms. Victoria Bruce and Mr. Ted Kolasa

Thursday, November 5, 2015

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8:00 AM-9:00 AM


Package FI Tutorial

8:00 AM-10:05 AM


16
Nanoprobing and Electrical Characterization
Session Chair: Mr. Randal E. Mulder and Mr. Kent Erington

9:00 AM-10:15 AM


17
Packaging and Assembly Level FA I
Session Chair: Dr. Lihong Cao and Mr. Bhanu P. Sood

10:05 AM-10:25 AM


Refreshment Break

10:25 AM-11:40 AM


18
Packaging and Assembly Level FA II
Session Chair: Mr. Bhanu P. Sood and Dr. Lihong Cao

19
Sample Preparation and Device Deprocessing I
Session Chair: Mr. Izak Kapilevich and Dr. Sam Subramanian

11:40 AM-12:40 PM


Thursday Lunch

12:40 PM-1:55 PM


20
Sample Preparation and Device Deprocessing II
Session Chair: Mr. Jake E. Klein and Mr. Roger Alvis

12:40 PM-2:20 PM


21
Case Studies and FA Process
Session Chair: Dr. Zhigang Song and Mrs. Rose Ring

1:55 PM-2:30 PM


Refreshment Break

2:05 PM-4:05 PM


Sample Prep / 3D Package Prep User Group

2:30 PM-4:30 PM


NanoProbing User Group