41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)

November 01 - 05, 2015

Mr. Chung Keow Ang

Infineon Technologies (Kulim) Sdn. Bhd.
Lot 10 & 11, Industrial Zone Phase II, Kulim Hi-Tech Park
Kulim Malaysia 09000

Papers:
15.3 Analysis approach on DMOS transistor Vth mismatch due to trapped charges