Dr. Franco Stellari

IBM Research
Yorktown Heights, NY
USA 10598

Papers:

Pushing the resolution of time-integrated emission images beyond the diffraction limit using image deconvolution
Automated Emission Data Registration and Segmentation for IC Analysis
Revealing SRAM content using photon-emission
High resolution stitched images
Single SRAM bit flip detection using photoemission microscopy
Multi phase Voltage Controlled Oscillator rotation
Chip voltage regulation observed using photoemission microscopy