42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)


Video Contest
Session Chair: Mrs. Rosalinda-Mendoza Ring

Sunday, November 6, 2016

8:00 AM-11:30 AM


Package and Physical Analysis Challenges I
Session Chair: Mr. Chris Richardson and Ms. Susan Li

8:00 AM-2:00 PM


Electrical and Yield
Session Chair: Dr. Jenny Ma and Mr. Gregory M. Johnson

8:00 AM-5:30 PM


Fault Isolation
Session Chair: Dr. Mayue Xie and Mr. David Vallett

1:00 PM-6:00 PM


Microscopy
Session Chair: Mr. Steven B. Herschbein and Dr. William E. Vanderlinde

2:00 PM-3:30 PM


Featured Talk - Device Medical
Session Chair: Mr. Mark Jenkins and Mr. Corey Senowitz

4:00 PM-5:00 PM


Featured Talk - Oil & Gas
Session Chair: Mr. Mark Jenkins and Mr. Corey Senowitz

5:00 PM-6:00 PM


Emerging Technology Specific FA
Session Chair: Mr. Mark Jenkins and Mr. Corey Senowitz

Monday, November 7, 2016

8:00 AM-9:15 AM

9:15 AM-9:35 AM

9:35 AM-11:40 AM


Emerging FA Techniques and Concepts
Session Chair: Dr. Jeffrey Lam and Mr. Dan Bodoh

11:40 AM-12:35 PM

12:35 PM-1:50 PM


Nanoprobing and Electrical Characterization I
Session Chair: Mr. Randall Mulder and Ms. Sweta Pendyala

12:35 PM-2:15 PM


Device FA
Session Chair: Mr. Phil Kaszuba and Mr. Terence Kane

Sample Preparation and Device Deprocessing
Session Chair: Dr. Zhigang Song and Dr. Erwin Hendarto

2:15 PM-2:25 PM

2:25 PM-3:40 PM


Case Studies and FA Process I
Session Chair: Dr. Yan Li, Mr. Apek Mulay and Ms. Jaya Chowdhury

Nanoprobing and Electrical Characterization II
Session Chair: Mr. Randall Mulder and Ms. Sweta Pendyala

Reverse Engineering I
Session Chair: Prof. Domenic Forte, PhD and Dr. Juana Rudati

3:40 PM-5:40 PM


NanoProbing User Group
Session Chair: Mr. Nicholas Antoniou and Dr. Jaya (Vijay) Chowdhury

Sample Prep / 3D Package Prep User Group
Session Chair: Mr. Nathan Bakken and Dr. Roger Stierman

5:00 PM-6:45 PM

7:00 PM-10:00 PM

Tuesday, November 8, 2016

9:15 AM-10:30 AM

10:30 AM-10:45 AM

10:45 AM-12:00 PM


Board and System Level FA I
Session Chair: Mr. Robert Champaign and Mr. Jason Wheeler

Case Studies and FA Process II
Session Chair: Dr. Yan Li, Mr. Apek Mulay and Ms. Jaya Chowdhury

12:00 PM-1:30 PM

1:30 PM-2:20 PM


Board and System Level FA II
Session Chair: Mr. Robert Champaign and Mr. Jason Wheeler

Package and Physical Analysis Challenges II
Session Chair: Mr. G. B. Anderson

2:20 PM-2:55 PM

2:55 PM-5:00 PM


FIB Circuit Analysis and Edit
Session Chair: Mr. Richard Livengood and Mr. Jason M. Benz, BS/MS Microelectronic Eng & Materials Science

Reverse Engineering II
Session Chair: Prof. Domenic Forte, PhD and Dr. Juana Rudati

5:00 PM-6:40 PM

Wednesday, November 9, 2016

8:00 AM-9:40 AM


3D Devices Failure Analysis
Session Chair: Mr. Frank Altmann and Ms. Claudia Keller

Scanning Probe Analysis I
Session Chair: Mrs. Rosalinda-Mendoza Ring and Mr. David L. Burgess

9:40 AM-10:10 AM

10:10 AM-12:15 PM

12:15 PM-1:30 PM

1:30 PM-3:30 PM


3D Devices Failure Analysis - Poster
Session Chair: Mr. Frank Altmann and Ms. Claudia Keller

Board and System Level FA - Poster
Session Chair: Mr. Robert Champaign and Mr. Jason Wheeler

Case Studies and FA Process - Poster
Session Chair: Dr. Yan Li, Mr. Apek Mulay and Ms. Jaya Chowdhury

Detecting and Preventing Counterfeit Microelectronics - Poster
Session Chair: Dr. Navid Asadi and Mr. Michael D. Woo

Device FA - Poster
Session Chair: Mr. Phil Kaszuba and Mr. Terence Kane

Emerging FA Techniques and Concepts - Poster
Session Chair: Jeffrey Lam and Mr. Dan Bodoh

FIB Circuit Analysis and Edit - Poster
Session Chair: Mr. Richard H. Livengood and Mr. Jason M. Benz, BS/MS Microelectronic Eng & Materials Science

FIB Sample Preparation - Poster
Session Chair: Dr. Bryan Tracy, PhD

Fault Isolation - Poster
Session Chair: Dr. Michael Bruce and Dr. Paiboon Tangyunyong

Microscopy - Poster
Session Chair: Mr. Ted Kolasa and Dr. Yu Zhu

Nanoprobing and Electrical Characterization - Poster
Session Chair: Mr. Randall Mulder and Ms. Sweta Pendyala

Packaging and Assembly Level FA - Poster
Session Chair: Mr. Bhanu P. Sood and Ms. Becky Holdford

Reverse Engineering - Poster
Session Chair: Prof. Domenic Forte, PhD and Dr. Juana Rudati

Sample Preparation and Device Deprocessing - Poster
Session Chair: Dr. Zhigang Song and Dr. Erwin Hendarto

Scanning Probe Analysis - Poster
Session Chair: Mrs. Rosalinda-Mendoza Ring and Mr. David L. Burgess

3:30 PM-6:00 PM


Case Studies and FA Process III
Session Chair: Dr. Yan Li, Mr. Apek Mulay and Ms. Jaya Chowdhury

Microscopy
Session Chair: Mr. Ted Kolasa and Dr. Yu Zhu

Thursday, November 10, 2016

8:00 AM-9:40 AM


FIB Sample Preparation
Session Chair: Dr. Bryan Tracy, PhD

Fault Isolation I
Session Chair: Dr. Michael Bruce and Dr. Paiboon Tangyunyong

9:40 AM-9:50 AM

9:50 AM-11:55 AM


Detecting and Preventing Counterfeit Microelectronics
Session Chair: Dr. Navid Asadi and Mr. Michael D. Woo

Packaging and Assembly Level FA
Session Chair: Mr. Bhanu P. Sood and Ms. Becky Holdford

11:55 AM-12:55 PM

12:55 PM-2:20 PM


Fault Isolation II
Session Chair: Dr. Michael Bruce and Dr. Paiboon Tangyunyong

Scanning Probe Analysis II
Session Chair: Mrs. Rosalinda-Mendoza Ring and Mr. David L. Burgess

2:20 PM-2:30 PM

2:30 PM-4:30 PM


Contactless Fault Isolation User Group
Session Chair: Patrick Pardy and Mr. Dan Bockelman

FIB User Group
Session Chair: Mr. Steven B. Herschbein and Mr. Dane Scott