42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016): http://www.asminternational.org/web/istfa-2016/home

42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016

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Mr. Christopher A. Pawlowicz

Director
Techinsights
Research and Development
Ottawa, ON
Canada K2K2X2

Papers:

Power Distribution Analysis of an Integrated Circuit using FIB Passive Voltage Contrast
Large Scale Integrated Circuit Schematic Reconstruction Below 14 nm – Challenges and Opportunities

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General Information

November 06 - 10, 2016


Fort Worth, TX