42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Mr. Alexander Sorkin
R&D Engineer
Techinsights
R&D
Ottawa,, ON
Canada K2K2X2
Papers:
Power Distribution Analysis of an Integrated Circuit using FIB Passive Voltage Contrast
