42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Dr. David Z. Pan
University of Texas at Austin
Austin, TX
USA 78712
Papers:
Gate-Level Netlist Reverse Engineering Tool Set for Functionality Recovery and Malicious Logic Detection
