42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Dr. Caiwen Yuan
Staff Engineer
Qualcomm Technologies Inc.
San Diego, CA
USA 97121
Papers:
Improved Method of ROI Encapsulaton During Axis Conversion of Cross-Sectional S/TEM Lamellae
