VLSI for space applications: Single event effect investigation and optical analysis on an integrated laser platform
VLSI for space applications: Single event effect investigation and optical analysis on an integrated laser platform
Wednesday, November 8, 2017: 4:20 PM
Ballroom A (Pasadena Convention Center)
Summary:
Up to date VLSI are neither designed nor manufactured for space applications that face SEE issues. In addition, we have only few pieces of information about the internal schematic and usually nothing on layout and netlist so commercial VLSI are quite black boxes for satellite manufacturers. On the other hand, their performances are very interesting for satellites. The only way to efficiently manage SEE VLSI is to cluster localization of sensitive areas, internal analysis of the region of interest concerned, and study of potential mitigation techniques and evaluation of their efficiency. For the first time, all these activities can be performed in the same tool with the same setup enabling a very efficient iterative process that could take days instead months. In this paper, we will show the integration of pulsed laser for SEE study in an all in one laser probing, laser stimulation, emission microscope system and demonstrate the full process on a commercial 8 bits microcontroller.
Up to date VLSI are neither designed nor manufactured for space applications that face SEE issues. In addition, we have only few pieces of information about the internal schematic and usually nothing on layout and netlist so commercial VLSI are quite black boxes for satellite manufacturers. On the other hand, their performances are very interesting for satellites. The only way to efficiently manage SEE VLSI is to cluster localization of sensitive areas, internal analysis of the region of interest concerned, and study of potential mitigation techniques and evaluation of their efficiency. For the first time, all these activities can be performed in the same tool with the same setup enabling a very efficient iterative process that could take days instead months. In this paper, we will show the integration of pulsed laser for SEE study in an all in one laser probing, laser stimulation, emission microscope system and demonstrate the full process on a commercial 8 bits microcontroller.