43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017): http://www.asminternational.org/web/istfa-2017/home

43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017

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Dr. Szu Huat Goh

Phd
GLOBALFOUNDRIES
Technology Development- New Technology Prototyping
Singapore Singapore 738406

Papers:

Failure debugging under product design knowledge constraints
IPFA Winner: A Detailed Analysis Scheme to Interpret Multiple Photon Emissions Micrograph for Improved Diagnostic Resolution on Open Defects

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General Information

November 05 - 09, 2017


Pasadena, CA