43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
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Dr. Tomonori nakamura
Hamamatsu Photonics
hamamatsu Japan 431-3196
Papers:
Open failure localization by using MOFM:Magneto-Optical Frequency Mapping system with 532 nm light source
