43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Mr. KE-YING LIN
Failure Analysis Engineer
NXP Semiconductors
Kaohsiung Taiwan 81170
Papers:
Fault Isolation of Leakage for Device with Non-uniform Epoxy Encapsulation
