43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Mr. Fulvio infante
Instraspec Technologies
Toulouse France 31400
Papers:
Magnetic Field Imaging on Stacked Flash Memories by Laser Probing (MOFM) and SQUID Scanning (MCI)
ESREF Winner: Single Event Transient Acquisition and Mapping For Space Device Characterization