43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
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Dr. Helen Grampeix
Univ. Grenoble Alpes
Grenoble France 38000
Papers:
STUDENT PAPER: Investigation of switching mechanism in HfO2-based oxide resistive memories by in-situ Transmission Electron Microscopy (TEM) and Electron Energy Loss Spectroscopy (EELS)