43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017): http://www.asminternational.org/web/istfa-2017/home

43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index

S Sharang

TESCAN Brno s.r.o.
Brno Czech Republic 62300

Papers:

Precision Xe Plasma FIB Delayering for Physical Failure Analysis of sub-20 nm Microprocessor Devices

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index
General Information

November 05 - 09, 2017


Pasadena, CA