44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Early life failures in automotive electronics and their root causes
Tuesday, October 30, 2018: 10:10 AM
226BC (Phoenix Convention Center)
Prof. Peter Jacob
,
EMPA Duebendorf (50%, 1993-today, Main Affiliation), Duebendorf, Switzerland
See more of:
Featured Tutorials II
See more of:
Tutorial