44th International Symposium for Testing and Failure Analysis (Oct. 28

44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)

Sunday, October 28, 2018

8:00 AM-10:00 AM

Package and Physical Analysis Challenges I
Session Chair: Mr. Chris Richardson and Mr. John Bescup

8:00 AM-11:20 AM

Electrical and Yield I
Session Chair: Mr. Randal E. Mulder and Mr. Gregory M. Johnson

8:00 AM-11:50 AM

Microscopy I
Session Chair: Ms. Susan Li and Ms. Rose Ring

10:20 AM-5:20 PM

Fault Isolation
Session Chair: Dr. Mayue Xie and Dr. Sebastian Brand

11:20 AM-2:30 PM

Featured Tutorials I
Session Chair: Mr. Mark Jenkins and Mr. Corey Senowitz

1:00 PM-2:30 PM

Microscopy II

2:50 PM-4:20 PM

Electrical and Yield II
Session Chair: Mr. Randal E. Mulder and Mr. Gregory M. Johnson

2:50 PM-5:20 PM

Package and Physical Analysis Challenges II
Session Chair: Mr. Chris Richardson and Mr. John Bescup

Monday, October 29, 2018

10:20 AM-12:20 PM

Emerging FA Techniques and Concepts
Session Chair: Mr. Dan Bodoh and Mr. Frank Altmann

12:00 PM-1:00 PM

Lunch

1:00 PM-2:40 PM

Fault Isolation
Session Chair: Dr. Keith A. Serrels and Mr. Joe Caroselli

1:00 PM-3:05 PM

Scanning Probe Analysis I
Session Chair: Mr. Phil Kaszuba and Dr. Paiboon Tangyunyong

3:05 PM-3:25 PM

Afternoon Refreshment Break

3:25 PM-4:15 PM

Scanning Probe Analysis II
Session Chair: Mr. Phil Kaszuba and Dr. Paiboon Tangyunyong

3:25 PM-4:40 PM

Board and System Level FA
Session Chair: Mr. Jason Wheeler and Ms. Becky Holdford

5:00 PM-6:45 PM

Tools of the Trade Tour

7:00 PM-10:00 PM

Social Event: Lucky Strike

Tuesday, October 30, 2018

8:00 AM-9:30 AM

Panel Session: Is it worth analyzing?
Session Chair: Ms. Susan Li and Ms. Renee Parente

9:30 AM-10:10 AM

Morning Refreshment Break

10:10 AM-11:40 AM

Featured Tutorials II
Session Chair: Mr. Corey Senowitz and Mr. Mark Jenkins

10:10 AM-11:50 AM

Detecting and Preventing Counterfeit Microelectronics
Session Chair: Mr. Michael D. Woo and Dr. Michael H. Azarian

10:35 AM-11:50 AM

Product Yield, Test & Diagnostics
Session Chair: Mr. Jayant DSouza and Mr. Amit M. Jakati

11:30 AM-1:00 PM

Lunch on the Expo Floor

1:00 PM-3:05 PM

3D Device Failure Analysis
Session Chair: Dr. Christian Schmidt and Dr. Jesse Alton

Hardware Attacks, Security, and Reverse Engineering I
Session Chair: Prof. Domenic Forte and Mr. Ujjwal Guin

3:05 PM-3:40 PM

Afternoon Refreshment Break

3:40 PM-5:10 PM

Microscopy III
Session Chair: Ms. Susan Li and Ms. Rose Ring

3:40 PM-5:20 PM

FA Processes Case Studies I
Session Chair: Dr. Erwin Hendarto and Dr. Chuan Zhang

5:30 PM-7:15 PM

Expo Networking Reception

Wednesday, October 31, 2018

8:00 AM-9:40 AM

FA Processes Case Studies II
Session Chair: Dr. Erwin Hendarto and Dr. Chuan Zhang

Sample Preparation and Device Deprocessing I
Session Chair: Mr. Ryan Fredrickson and Mr. Hueihao Yap

9:40 AM-10:10 AM

Morning Refreshment Break

10:10 AM-11:40 AM

Keynote Session

11:30 AM-1:00 PM

Lunch on the Expo Floor

1:05 PM-1:30 PM

Mixed Mode & High Power Devices Case Studies
Session Chair: Mr. Stephen T. Fasolino and Mr. Jared Eisenhower

1:05 PM-2:20 PM

Sample Preparation and Device Deprocessing II
Session Chair: Mr. Ryan Fredrickson and Mr. Huei Hao Yap

1:30 PM-2:20 PM

Nanoprobing and Electrical Characterization I
Session Chair: Ms. Sweta Pendyala and Mr. John Sanders

2:20 PM-4:20 PM

3D Device FA - POSTER
Session Chair: Dr. Christian Schmidt and Dr. Jesse Alton

Board and System Level FA - POSTER
Session Chair: Mr. Jason Wheeler and Ms. Becky Holdford

FA Processes Case Studies - POSTER
Session Chair: Dr. Erwin Hendarto and Dr. Chuan Zhang

FIB Circuit Analysis and Edit - POSTER
Session Chair: Dr. Ken Lagarec and Dr. Shida Tan

FIB Sample Preparation - POSTER
Session Chair: Dr. Bryan Tracy, PhD and Mr. Antonio Tollis

Fault Isolation - POSTER
Session Chair: Dr. Keith A. Serrels and Mr. Joe Caroselli

Low Power Devices and Test Structures Case Studies - POSTER
Session Chair: Dr. Michael Bruce and Ms. Rose Ring

Mixed Mode & High Power Devices Case Studies - POSTER
Session Chair: Mr. Stephen T. Fasolino and Mr. Jared Eisenhower

Packaging & Assembly Level FA - POSTER
Session Chair: Dr. Peng Li and Ms. Kannu Wadhwa

Poster Session

Product Yield, Test & Diagnostics - POSTER
Session Chair: Mr. Jayant DSouza and Mr. Amit M. Jakati

Sample Prep and Device Processing - POSTER
Session Chair: Mr. Ryan Fredrickson and Mr. Huei Hao Yap

Scanning Probe Analysis - POSTER
Session Chair: Mr. Phil Kaszuba and Dr. Paiboon Tangyunyong

Video Contest
Session Chair: Ms. Rose Ring

4:20 PM-5:10 PM

Nanoprobing and Electrical Characterization II
Session Chair: Ms. Sweta Pendyala and Mr. John Sanders

Space Application FA
Session Chair: Mr. Ted Kolasa and Dr. Richard Blank

5:20 PM-7:20 PM

User Group: Sample Preparation
Session Chair: Mr. Jim Colvin

Thursday, November 1, 2018

8:00 AM-9:40 AM

FIB Sample Preparation
Session Chair: Dr. Bryan Tracy, PhD and Mr. Antonio Tollis

Microscopy I
Session Chair: Dr. Lianfeng Fu, Dr. Edgar voelkl, PhD in Physics and Mr. Yifei Meng

9:40 AM-9:50 AM

Morning Refreshment Break

9:50 AM-11:30 AM

Microscopy II
Session Chair: Dr. Lianfeng Fu, Dr. Edgar Voelkl, PhD in Physics and Mr. Yifei Meng

Packaging & Assembly Level FA
Session Chair: Dr. Peng Li and Ms. Kannu Wadhwa

11:30 AM-1:30 PM

Lunch

User Group: Contactless Optical / Nano-Probing EFA User Group
Session Chair: Mr. Dan Bockelman

User Group: FIB
Session Chair: Mr. Steven B. Herschbein

1:30 PM-2:45 PM

FIB Circuit Analysis and Edit
Session Chair: Dr. Ken Lagarec and Dr. Shida Tan

Low Power Devices and Test Structures Case Studies
Session Chair: Dr. Michael Bruce and Ms. Rose Ring