44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Ms. YX Seah
Advanced Micro Devices - Singapore Pte Ltd1
Singapore Singapore 469032
Papers:
Pattern search automation for combinational logic analysis
