44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Dr. Bill Cardoso
CEO
Creative Electron
SAN MARCOS, CA
USA 92078
Papers:
A New Method to Authenticate Components and PCB Assemblies Using Fingerprint from X-Ray Images
