44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018
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Mr. Warren Jolley
PrimeNano, Inc.
Palo Alto, CA
USA 94306
Papers:
Finite Element Modeling and Quantitative Measurement using sMIM to Characterize Low k Dielectric Films
