44th International Symposium for Testing and Failure Analysis (Oct. 28 - Nov. 1, 2018)
October 28 - November 01, 2018
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Dr. Prasoon Joshi
Sr. FA engineer
Intel Corp.
CQN Labs
Hillsboro, OR
USA 97124
Papers:
Electron beam probing of active advanced FinFET circuit with fin level resolution
