45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019
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Integrated Diffractive Lenses for Ultrathin Silicon
Wednesday, November 13, 2019
Exhibit Hall D (Oregon Convention Center)
Dr. Marc van Veenhuizen
,
NXP Semiconductors, Nijmegen, Netherlands
Mr. Peter van der Cruijsen
,
NXP Semiconductors, Nijmegen, Netherlands
Dr. Keith Serrels
,
NXP Semiconductors, Austin, TX
Dr. Frank Zachariasse
,
NXP Semiconductors, Nijmegen, Netherlands
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Emerging FA Techniques - POSTER
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Technical Program