Focused Ion Beam (FIB) for Microchip Circuit Edit and Fault Isolation
Tuesday, November 12, 2019: 10:10 AM
F 150/151 (Oregon Convention Center)
Mr. Steven B. Herschbein
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Dr. Shida Tan
,
Intel Corporation, Santa Clara, NY
Mr. Carmelo F. Scrudato
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Mr. Richard H. Livengood
,
Intel Corporation, Santa Clara, NY
Mr. Edward S. Hermann
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Mr. Michael Wong
,
Thermo Fisher Scientific, Hillsboro, OR
Mr. Kyle M. Winter
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Mr. Brian Yates
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Mr. Raymond L. Wagner
,
GLOBALFOUNDRIES, Hopewell Junction, NY
