45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019): Tutorial

Tutorial

Other

Electrical and Yield
Session Chair: Mr. Yan Li and Greg Johnson

Package and Physical Analysis Challenges
Session Chair: Mr. Chris Richardson and Mr. John Bescup

Fault Isolation
Session Chair: Dr. Mayue Xie and Dr. Sebastian Brand

Featured Talk
Session Chair: Mr. Mark Jenkins and Mr. Corey Senowitz

Microscopy
Session Chair: Ms. Susan Li and Ms. Rose Ring

Package and Physical Analysis Challenges II
Session Chair: Mr. Chris Richardson and Mr. John Bescup

Electrical and Yield II
Session Chair: Mr. Yan Li and Greg Johnson

Microscopy II
Session Chair: Ms. Susan Li and Ms. Rose Ring

Featured Talk II
Session Chair: Mr. Mark Jenkins and Mr. Corey Senowitz

Microscopy III
Session Chair: Ms. Susan Li and Ms. Rose Ring