45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019):

45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019

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Dr. Martine Simard-Normandin

President
MuAnalysis Inc.
Ottawa, ON
Canada K1G 4J7

Papers:

SIMS, Secondary Ion Mass Spectroscopy for counterfeit detection of Electrical, Electronic, and Electromechanical (EEE) parts.
Shining a Light on LED Technology: Construction, Reliability, Qualification, Failure Modes
Failure Analysis of Electronic Devices

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General Information

November 10 - 14, 2019


Portland, OR