45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019
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Dr. Martine Simard-Normandin
President
MuAnalysis Inc.
Ottawa, ON
Canada K1G 4J7
Papers:
SIMS, Secondary Ion Mass Spectroscopy for counterfeit detection of Electrical, Electronic, and Electromechanical (EEE) parts.
Shining a Light on LED Technology: Construction, Reliability, Qualification, Failure Modes
Failure Analysis of Electronic Devices