SIMS, Secondary Ion Mass Spectroscopy for counterfeit detection of Electrical, Electronic, and Electromechanical (EEE) parts.
SIMS, Secondary Ion Mass Spectroscopy for counterfeit detection of Electrical, Electronic, and Electromechanical (EEE) parts.
Tuesday, November 12, 2019: 11:40 AM
F 150/151 (Oregon Convention Center)
Summary:
This presentation demonstrates how Secondary Ion Mass Spectroscopy provides unique quantitative information to identify suspect counterfeit semiconductor devices. An example is shown where the epitaxial layers of a LED device do not match those of the exemplar.
This presentation demonstrates how Secondary Ion Mass Spectroscopy provides unique quantitative information to identify suspect counterfeit semiconductor devices. An example is shown where the epitaxial layers of a LED device do not match those of the exemplar.