45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019):

45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019

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Ms. Qindi Wu

Director
Maxim Integrated
San Jose, CA
USA 95134

Papers:

Root Cause Analysis of High Input Offset Voltage in Mixed-Signal Design Through Nanoprobing and Cadence Simulation

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General Information

November 10 - 14, 2019


Portland, OR