45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Ms. Qindi Wu
Director
Maxim Integrated
San Jose, CA
USA 95134
Papers:
Root Cause Analysis of High Input Offset Voltage in Mixed-Signal Design Through Nanoprobing and Cadence Simulation