45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019):

45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019

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Mr. Randall Wells

Globalfoundries
Essex Junction, VT
USA 05452

Papers:

Scanning Capacitance Microscopy and Spectroscopy for Root Cause Analysis on Location Specific Individual FinFET Devices

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General Information

November 10 - 14, 2019


Portland, OR