Mr. Chong Khiam Oh

Manager
Globalfoundries Inc. Malta, NY USA
Malta, NY
USA 12020

Papers:

Capacitance Characterization of Gate to LDD Overlap region to understand subtle fail modes in advanced node technologies
Nanoprobe characterization of Soft SRAM Bit Fails in Advanced Technology
Application of Two-pin EBIC Technique to Isolate the Defective Fin(s) in Advanced Bulk FinFET Devices