45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019):

45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019

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Mr. Phong Tran

IBM
Hopewell Junction, NY
USA NY 12533

Papers:

Residual EG Oxide in FinFET Analyses and Its Impact to Yield, Product Performance, and Transistor Reliability

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General Information

November 10 - 14, 2019


Portland, OR