Mr. Satish Kodali

Member of Technical Staff
GLOBALFOUNDRIES Inc.
Electrical Failure Analysis
Malta, NY
USA 12020

Papers:

Application of Nanoprobing on the subtle defect in the embedded non-volatile memory device
Capacitance Characterization of Gate to LDD Overlap region to understand subtle fail modes in advanced node technologies
Nanoprobe characterization of Soft SRAM Bit Fails in Advanced Technology