45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019):

45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019

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Puneet Gupta

NVIDIA
Advanced Technology Group
Santa Clara, CA
USA 95050

Papers:

V-Pulse Technique For Optical Isolation Of Latchup Triggers In Sub 14 nm Standard-Cell Logic And Memory
MBIST Driven SRAM Failure Analysis Using Laser Voltage Imaging and Laser Voltage Probing

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General Information

November 10 - 14, 2019


Portland, OR