45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019):

45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019

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Mr. Jake Jensen

Applications Engineer
Thermo Fisher Scientific
Hillsboro, OR
USA 97124

Papers:

Super XHR Cross-Sectional SEM Imaging & EDS Analysis: A Systematic Method for High-Fidelity Microstructure Characterization of Dense SRAM FinFET Structures

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General Information

November 10 - 14, 2019


Portland, OR