Super XHR Cross-Sectional SEM Imaging & EDS Analysis: A Systematic Method for High-Fidelity Microstructure Characterization of Dense SRAM FinFET Structures

Wednesday, November 13, 2019

Exhibit Hall D (Oregon Convention Center)

Mr. Zdenek Kral , Thermo Fisher Scientific, Hillsboro, OR

Mr. Jake Jensen , Thermo Fisher Scientific, Hillsboro, OR

Mrs. Lisa McGill , Thermo Fisher Scientific, Hillsboro, OR

Mr. Trevan Landin , Thermo Fisher Scientific, Hillsboro, OR

Mr. Stephen M. Seddio , Thermo Fisher Scientific, Madison, WI

Mr. Chris Stephens , Thermo Fisher Scientific, Madison, WI

Mr. Roger Alvis , Thermo Fisher Scientific, Hillsboro, OR