Fault Isolation

Wednesday, November 13, 2019: 1:40 PM-2:30 PM
D 137/138 (Oregon Convention Center)
Mr. Dan Bodoh, NXP Semiconductors and Dr. Jesse Alton, TeraView Limited
1:40 PM
Dynamic photon emission on FinFET devices through novel scan test approaches
Mr. Gopinath Ranganathan, Advanced Micro Devices - Singapore Pte Ltd; Mr. Venkat Ravikumar, SIngapore University of Technology and Design; SL Phoa, Advanced Micro Devices - Singapore Pte Ltd; Mr. Winson lua, Advanced Micro Devices - Singapore Pte Ltd; Mr. Jie Jin, Advanced Micro Devices - Singapore Pte Ltd
2:05 PM
Thermal Failure Analysis of Functional Failures by IR Lock-in Thermal Emission
Mr. Paul Hubert P. Llamera, Maxim Integrated; Ms. Camille Joyce Garcia, Maxim Integrated - Philippines
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