Fault Isolation of Metal-Insulator-Metal (MiM) Capacitor Failures by Lock-in Thermography (LIT)

Wednesday, December 9, 2020: 10:00 AM
Mr. KE-YING LIN , NXP Semiconductors, Kaohsiung, Taiwan

Summary:

Phase LIT image could provide accurate fault localization and useful initial fault isolation results of defective MiM capacitor over OBIRCH or amplitude LIT by using either a pin-to-pin biasing condition or a functional mode setup.