Case Studies: Device Analysis

Wednesday, December 9, 2020: 10:00 AM-12:05 PM
Mr. Stephen Fasolino, Raytheon and Mr. Jeff Gambino, ON Semiconductor
10:25 AM
Word Line defect localization methods in 2D NAND flash
Ms. Pei Ning Hsu, Macronix International Co., LTD.; Mr. Chung Huan Chang, Macronix International Co., LTD.; Ms. Yu Min Chung, Macronix International Co., LTD.
10:50 AM
Qualification and selection philosophy for the SuperCam IRS photodiode on Perseverance Rover
Dr. Sophie Jacquinod, LESIA - Observatoire de Paris (Université PSL, CNRS, Sorbonne Université, Université de Paris); Dr. Kateryna Kiryukhina, Centre National d'Etudes Spatiales (CNES); Dr. Guy Perez, Centre National d'Etudes Spatiales (CNES); Mr. Napoléon Nguyen Tuong, LESIA - Observatoire de Paris (Université PSL, CNRS, Sorbonne Université, Université de Paris); Dr. Yann Hello, Observatoire des Sciences de l’Univers de la Réunion; Dr. Julien Mekki, Centre National d'Etudes Spatiales (CNES); Dr. Olivier Gilard, Centre National d'Etudes Spatiales (CNES); Mr. Jérôme Parisot, LESIA - Observatoire de Paris (Université PSL, CNRS, Sorbonne Université, Université de Paris); Mr. Jean-Michel Reess, LESIA - Observatoire de Paris (Université PSL, CNRS, Sorbonne Université, Université de Paris); Mrs. Marina Heim, Centre National d'Etudes Spatiales (CNES); Mrs. Estelle Raynal, Centre National d'Etudes Spatiales (CNES); Mr. Frédéric Chapron, LESIA - Observatoire de Paris (Université PSL, CNRS, Sorbonne Université, Université de Paris); Dr. Guillaume Bascoul, Centre National d'Etudes Spatiales (CNES)
11:15 AM
Bottom Electrode Properties and Electrical Field Cycling Effects on HfOx based Resistive Switching Memory Device
Dr. Juntao Li, IBM Research; Dr. Youngseok Kim, IBM Research; Dr. Dexin Kong, IBM Research; Dr. Kangguo Cheng, IBM Research; Dr. Soon-Cheon Seo, IBM Research; Mr. Cory Robinson, IBM Research; Dr. Ramachandran Muralidhar, IBM Research; Dr. Nicole Saulnier, IBM Research; Dr. Robert Robison, IBM Research; Dr. Alex Varghese, IBM Research; Dr. Ishtiaq Ahsan, IBM Research; Dr. Takashi Ando, IBM Research; Dr. Vijay Narayanan, IBM Research
11:40 AM
Yield and Failure Analysis of FinFET Source to Drain Leakage in 14nm Technology
Dr. Felix Beaudoin, GLOBALFOUNDRIES; Mr. Satish Kodali, GLOBALFOUNDRIES; Mr. Rohan Deshpande, GLOBALFOUNDRIES; Dr. Wayne Zhao, GLOBALFOUNDRIES; Dr. Edmund Banghart, GLOBALFOUNDRIES; Rinus Lee, GLOBALFOUNDRIES; Thirukumaran Mahalingam, GLOBALFOUNDRIES; Nuh Yuksek, GLOBALFOUNDRIES; Lu Yuan, GLOBALFOUNDRIES; Wang Tao, GLOBALFOUNDRIES; Lillian Li, GLOBALFOUNDRIES; Sushruth Goud Perumalla, GLOBALFOUNDRIES; Shweta Arora, GLOBALFOUNDRIES; Trejo Rust, GLOBALFOUNDRIES
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