FAULT ISOLATION: Unlocking novel FA case studies using a Lock-in Amplifier

Tuesday, December 8, 2020: 1:50 PM
Mr. Sukho Lee , NXP Semiconductors, Nijmegen, Netherlands
Dr. Marc van Veenhuizen , NXP Semiconductors, Nijmegen, Netherlands
Dr. Paolo Navaretti , Zurich Instruments, Zurich, Switzerland
Dr. Gaia Donati , Zurich Instruments, Zurich, Switzerland

See more of: Poster Session I
See more of: EDFAS Virtual Workshop