Failure Analysis of Total-Dose Radiation-Induced Degradation on FinFET Logic ICs

Monday, December 7, 2020: 1:30 PM
Dr. Joy Y. Liao , NVIDIA, Santa Clara, CA
Dr. Somayyeh Rahimi , NVIDIA Corporation, Santa Clara, CA
Dr. Christian Schmidt , NVIDIA Corporation, Santa Clara, CA
Mr. Howard Lee Marks , NVIDIA, Santa Clara, CA

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