Product Yield, Test & Diagnostics

Monday, December 7, 2020: 1:30 PM-2:45 PM
Mr. Jayant D'Souza, Mentor, a Siemens Business and Mr. Rommel Estores, ON Semiconductor
1:30 PM
Failure Analysis of Total-Dose Radiation-Induced Degradation on FinFET Logic ICs
Dr. Joy Y. Liao, NVIDIA; Dr. Somayyeh Rahimi, NVIDIA Corporation; Dr. Christian Schmidt, NVIDIA Corporation; Mr. Howard Lee Marks, NVIDIA
1:55 PM
Nano-Indentation for Evaluating Low-K Dielectric Adhesion
Mr. Jeff Gambino, ON Semiconductor
2:20 PM
On Debugging Intermittent Chain Hold-time Failures Caused by Process Variations for FinFET Technology
Dr. Huaxing Tang, Mentor, a Siemens Business; Mr. Allen Yang, UniSOC; Mr. Zhanjun Shu, UniSOC; Mr. Eden Cai, UniSOC; Mr. Shizhong Chen, UniSOC; Ms. Xin Wen, Mentor, a Siemens Business; Mr. Fanjin Meng, Mentor, a Siemens Business
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