PRODUCT YIELD, TEST & DIAGNOSTICS: A Study on the Early Detection of Metal Line Bridge Defects Using Wafer Burn-in Stress
Tuesday, December 8, 2020: 2:35 PM
Mr. Kyunghwui Min
,
Samsung Electronics, Hwaseong, Korea, Republic of (South)
Mrs. Hayoung Kwon
,
Samsung Electronics, Hwaseong, Korea, Republic of (South)
Mr. Seihui Lee
,
Samsung Electronics, Hwaseong, Korea, Republic of (South)
Dr. Sungsoo Yim
,
Samsung Electronics, hwaseong, Korea, Republic of (South)
Mr. Heeil Hong
,
Samsung Electronics Co.,Ltd, Hwaseong City, Korea, Republic of (South)
Mr. Jonghoon Kim
,
Samsung Electronics, Hwaseong, Korea, Republic of (South)
Mr. Jung-Bae Lee
,
Samsung Electronics, hwaseong, Korea, Republic of (South)
