MICROSCOPY: Semiconductor device radiation damage in TEM

Tuesday, December 8, 2020: 1:35 PM
Mr. Timothy Yeow , Thermo Fisher Scientific, Eindhoven, Netherlands
Dr. Dong Tang , Thermo Fisher Scientific, Eindhoven, Netherlands
Dr. Alexandrou Ioannis , Thermo Fisher Scientific, Eindhoven, Netherlands
Guoda Lian , IBM Inc., New York, NY
Steve Boettcher , IBM Inc., New York, NY
Ali Malik , IBM Inc., New York, NY

See more of: Poster Session II
See more of: EDFAS Virtual Workshop