MICROSCOPY: Semiconductor device radiation damage in TEM
Tuesday, December 8, 2020: 1:35 PM
Mr. Timothy Yeow
,
Thermo Fisher Scientific, Eindhoven, Netherlands
Dr. Dong Tang
,
Thermo Fisher Scientific, Eindhoven, Netherlands
Dr. Alexandrou Ioannis
,
Thermo Fisher Scientific, Eindhoven, Netherlands
Guoda Lian
,
IBM Inc., New York, NY
Steve Boettcher
,
IBM Inc., New York, NY
Ali Malik
,
IBM Inc., New York, NY