IC Decomposition and Imaging Metrics to Optimize Design File Recovery for Verification and Validation

Monday, December 7, 2020: 3:55 PM

Dr. Adam R. Waite , Battelle Memorial Institute, Columbus, OH

Mr. Jonathan Scholl , Battelle Memorial Institute, Columbus, OH

Mr. Joshua G. Baur , Battelle Memorial Institute, Columbus, OH

Dr. Adam Kimura , Battelle Memorial Institute, Columbus, OH

Mr. Michael P Strizich , MicroNet Solutions Inc, Albuquerque, NM

Mr. Glen D. Via , AFRL, WPAFB, OH

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