Microscopy

Monday, December 7, 2020: 3:30 PM-4:20 PM
Mr. Ryan Fredrickson, On Semiconductor
3:30 PM
Elemental TEM Tomography of Phase Change Memory Artificial Intelligence Hardware Case Study
Dr. James J. Demarest, IBM; Dr. Kevin Brew, IBM; Dr. Hemanth Jagannathan, IBM; Mr. Odunayo Ogundipe, IBM; Dr. Michael Rizzolo, IBM; Mr. Cory Robinson, IBM; Mr. Lukas Tierney, IBM; Mr. Kerry Toole, IBM
3:55 PM
IC Decomposition and Imaging Metrics to Optimize Design File Recovery for Verification and Validation
Dr. Adam R. Waite, Battelle Memorial Institute; Mr. Jonathan Scholl, Battelle Memorial Institute; Mr. Joshua G. Baur, Battelle Memorial Institute; Dr. Adam Kimura, Battelle Memorial Institute; Mr. Michael P Strizich, MicroNet Solutions Inc; Mr. Glen D. Via, AFRL
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