FIB SAMPLE PREPARATION: Automated sample depth targeting with low kV cleaning by Focused Ion Beam Microscopy for Atom Probe Tomography

Tuesday, December 8, 2020: 2:05 PM
Mr. Woo Jun Kwon , Thermo Fisher Scientific, Suwon-si, Gyeonggi-Do, Korea, Republic of (South)
Jisu Ryu , Thermo Fisher Scientific, Suwon-si, Gyeonggi-Do, Korea, Republic of (South)
Michael Schmidt , Thermo Fisher Scientific, Hillsboro, OR
Nicholas Croy , Thermo Fisher Scientific, Hillsboro, OR
Dr. Christopher H. Kang , Thermo Fisher Scientific, Suwon-si, Gyeonggi-Do, Korea, Republic of (South)

See more of: Poster Session II
See more of: EDFAS Virtual Workshop