High Spatial and Energy Resolution Fault Isolation by Electron Beam Probing for Advanced Technology Nodes

Wednesday, December 9, 2020: 2:20 PM
Mrs. Jennifer Huening , Intel, Hillsboro, OR
Dr. Prasoon Joshi , Intel Corp., Hillsboro, OR
Dr. Hyuk Ju Ryu , Intel, Hillsboro, OR
Dr. Wen-Hsien Chuang , Intel, Hillsboro, OR
Dr. Di Xu , Intel, Hillsboro, OR
Mrs. May Ling Oh , Intel, Hillsboro, OR
Mr. Shuai Zhao , Intel, Hillsboro, OR
Dr. Tom X. Tong , Intel, Hillsboro, OR

See more of: Fault Isolation I
See more of: EDFAS Virtual Workshop