Fault Isolation I

Wednesday, December 9, 2020: 2:20 PM-3:10 PM
Mr. Dan Bodoh, NXP Semiconductors and Dr. Jesse Alton, TeraView Limited
2:20 PM
High Spatial and Energy Resolution Fault Isolation by Electron Beam Probing for Advanced Technology Nodes
Mrs. Jennifer Huening, Intel; Dr. Prasoon Joshi, Intel Corp.; Dr. Hyuk Ju Ryu, Intel; Dr. Wen-Hsien Chuang, Intel; Dr. Di Xu, Intel; Mrs. May Ling Oh, Intel; Mr. Shuai Zhao, Intel; Dr. Tom X. Tong, Intel
2:45 PM
Short wavelength probing for fault isolation applications
Mr. Venkat Ravikumar, SIngapore University of Technology and Design; Mr. Winson lua, Advanced Micro Devices - Singapore Pte Ltd; Mr. Vasanth somasundaram, SIngapore University of Technology and Design, Advanced Micro Devices - Singapore Pte Ltd; Prof. Joel JKW yang, SIngapore University of Technology and Design; Prof. KL pey, SIngapore University of Technology and Design; Ms. Angeline Phoa, Advanced Micro Devices - Singapore Pte Ltd
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