Enhanced Failure Analysis (FA) of Organic Contamination Using Submicron Simultaneous IR and Raman Spectroscopy: Breakthrough Developments of Optical Photothermal IR (O-PTIR) Spectroscopy
Enhanced Failure Analysis (FA) of Organic Contamination Using Submicron Simultaneous IR and Raman Spectroscopy: Breakthrough Developments of Optical Photothermal IR (O-PTIR) Spectroscopy
Monday, December 7, 2020: 11:40 AM
Summary:
Traditional FT-IR systems have limited spatial resolution for small contamination, often requiring special sample preparation or contact using an attenuated total reflection (ATR) accessory. We will introduce a new technology that overcomes these limitations in a single microscope platform to provide complimentary and, confirmatory analysis if needed, via simultaneous IR and Raman spectroscopic information.
Traditional FT-IR systems have limited spatial resolution for small contamination, often requiring special sample preparation or contact using an attenuated total reflection (ATR) accessory. We will introduce a new technology that overcomes these limitations in a single microscope platform to provide complimentary and, confirmatory analysis if needed, via simultaneous IR and Raman spectroscopic information.