Enhanced Failure Analysis (FA) of Organic Contamination Using Submicron Simultaneous IR and Raman Spectroscopy: Breakthrough Developments of Optical Photothermal IR (O-PTIR) Spectroscopy

Monday, December 7, 2020: 11:40 AM
Mr. Jay Anderson , Photothermal Spectroscopy Corp., Santa Barbara, CA
Dr. Mustafa Kansiz, PhD , Photothermal Spectroscopy Corp., Santa Barbara, CA
Dr. Michael K. Lo , Photothermal Spectroscopy Corp., Santa Barbara, CA
Dr. Eoghan Dillon , Photothermal Spectroscopy Corp., Santa Barbara, CA
Dr. Curtis Marcott, PhD , Light Light Solutions, Athens, GA

Summary:

Traditional FT-IR systems have limited spatial resolution for small contamination, often requiring special sample preparation or contact using an attenuated total reflection (ATR) accessory. We will introduce a new technology that overcomes these limitations in a single microscope platform to provide complimentary and, confirmatory analysis if needed, via simultaneous IR and Raman spectroscopic information.