Emerging FA Techniques and Concepts
Monday, December 7, 2020: 10:50 AM-12:30 PM
Dr. Keith Serrels, NXP Semiconductors and Dr. William Lo, NVIDIA Corporation
10:50 AM
Analog and Mixed Signal Diagnosis flow using fault isolation techniques and simulation
Mr. Tommaso MELIS, Univ. Grenoble Alpes, CNRS, Grenoble INP*, TIMA, * Institute of Engineering Univ. Grenoble Alpes, ST microelectronics;
Dr. Emmanuel SIMEU, Univ. Grenoble Alpes, CNRS, Grenoble INP*, TIMA, * Institute of Engineering Univ. Grenoble Alpes;
Mr. Etienne Auvray, ST microelectronics
11:15 AM
Addressing Failure Analysis Challenges in Advanced Packages and MEMS using a novel Phase and Darkfield X-ray Imaging System
Mr. S.H. Lau, Sigray, Inc.;
Dr. Sheraz Gul, Sigray, Inc.;
Dr. David Vine, Sigray, Inc.;
Dr. Guibin Zan, Stanford University;
Ms. Sylvia Lewis, Sigray, Inc.;
Dr. Wenbing Yun, PhD, Sigray, Inc.
