Back End of Line (BEOL) Pulse Nanoprobing Fault Isolation Technique on RF Device with Soft Failure Issue
Wednesday, December 9, 2020: 2:45 PM
Mr. P. K. Tan
,
Globalfoundries Singapore Pte Ltd., Singapore, Singapore
Dr. Chang Qing Chen
,
GLOBALFOUNDRIES Singapore Pte Ltd, Singapore, Singapore
Mr. F. Rivai
,
Globalfoundries Singapore Pte Ltd., Singapore, Singapore
Dr. Alfred C.T. Quah
,
GLOBALFOUNDRIES Singapore Pte Ltd, Singapore, Singapore
Mr. P.T. Ng
,
Globalfoundries Singapore Pte Ltd., Singapore, Singapore
Mr. Shreyas Mohan Parab
,
Globalfoundries Singapore Pte Ltd., Singapore, Singapore
Mr. Yinzhe Ma
,
Globalfoundries Singapore Pte Ltd., Singapore, Singapore
Mr. Ran He
,
Chartered Semiconductor Manufacturing Pte. Ltd., Singapore, Singapore
